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Home Industry News Agilent Technologies launches new atomic force microscope

Agilent Technologies launches new atomic force microscope

10th March 2009

Agilent Technologies has launched a new atomic force microscope (AFM) called 5600LS.

Jeff Jones is the operations manager for the company’s AFM facility. He explained how this latest model is the first of its kind to be available commercially.

The device allows imaging of large samples in air, as well as in liquid under temperature control with a high-resolution nine-micron scanner, Mr Jones remarked.

He noted: "This advanced multipurpose AFM enables a remarkably broad set of nanotechnology applications, including semiconductor, materials science and life science studies."

The firm behind the technology stated the gadget uses a fully addressable 200 x 200 mm stage.

For ultimate flexibility, the company said the microscope can accommodate either a single large sample or many smaller ones.

It is also compatible with Agilent’s scanning microwave microscopy (SMM) mode.

For the first time ever it can combine the compound, calibrated electrical measurement capabilities of a microwave vector network analyser, the business concluded.

Agilent Technologies offers high-precision, modular AFM solutions intended for use in research, industry and education.

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