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Home Industry News Andor Technology launches new X-ray camera

Andor Technology launches new X-ray camera

26th August 2008

Andor Technology has unveiled the latest addition to its range of scientific imaging and spectroscopy equipment – the iKon-M X-ray camera.

The camera, which extends Andor’s iKon range of low-light imaging cameras, is designed to deliver high-performance direct detection X-ray imaging and comes in two design variations.

The DO iKon-M is designed for use with vacuum chambers, while the DY model is a stand-alone camera that uses a beryllium input window.

Both designs of the new iKon-M have “very low read floor noise”, the company said, with high QE across the X-ray, XUV and EUV energy ranges. They also come with “negligible” dark current, with thermoelectric cooling that brings temperatures as low as 90 degrees C.

With readout speeds of up to 2.5 MHz, the cameras are designed for faster frame rate imaging of dynamic processes, Andor added.

The firm’s market development manager, Dr Colin Coates, said: “The iKon-M X-ray offers unparalleled thermoelectric cooling and ultra low noise readout, making it ideal for a range of applications including; Soft X-ray imaging, Lithography, X-ray microscopy, Beam profilometry, and Plasma diagnostics.”

Andor is based in Belfast, Northern Ireland.

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