Horiba Scientific launches new Uvisel Plus ellipsometer

Horiba Scientific has announced the launch of a new modular ellipsometer, Uvisel Plus, which is designed for enhanced flexibility in thin film measurements.

The device comes equipped with cutting-edge FastAcq acquisition technology, which utilises a new electronic data processing and high speed monochromator to enable a sample high-resolution measurement from 190 to 2100nm to be completed within three minutes.

Another key element of the design is the fact that it incorporates no rotating elements or additional components in the optical path, delivering the most pure and efficient polarisation modulation for accurate ellipsometric parameter measurements.

Uvisel Plus offers microspots for patterned samples down to 50 micrometres, variable angles from 40 to 90 degrees, an automatic horizontal mapping stage and accessories to meet a variety of application and budgetary needs.

The company said: "The Uvisel Plus and its FastAcq technology is the most versatile spectroscopic ellipsometer for thin film thickness and optical constant measurements in the fields of materials research and processing, flat panel displays, microelectronics and photovoltaics."

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