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Home Industry News Micromeritics to demonstrate at Pittcon

Micromeritics to demonstrate at Pittcon

25th February 2008

Micromeritics has announced that it is to unveil some of its latest technologies at this year’s Pittcon conference next month.

The event, which runs from March 2nd to March 7th in New Orleans, Louisiana, will see the firm demonstrate its new particle characterisation instrumentation.

According to the firm, those visiting the conference will have the opportunity to "get a hands-on look at a variety of new instruments" and the chance to speak to members of its technical, sales and customer support departments.

Among the instruments on display will be the TriStar II 3020 Surface Area and Porosity Analyzer – a fully automated, three-station analyzer that can collect 1,000 data points.

The company was founded by Warren Hendrix and Clyde Orr in July 1962, and claims to have been the first to market "commercially automated surface area, mercury penetration and sedimentation particle size analysers".

Its headquarters are based in Atlanta, Georgia.
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