Bruker Introduces Contour LS-K 3D Optical Profiler

Bruker announces the release of its new Contour LS-K 3D optical profiler with LightSpeed™ focus variation technology. The Contour LS-K uniquely enables both easy-to-acquire high-resolution images and reliable metrology data.

The LightSpeed focus variation method is ideal for surfaces with significant roughness, large step heights, or steep angles and is a perfect complement to the existing Bruker ContourGT white light interferometry product line, which is optimized toward smoother surfaces and nanometer resolution. Engineers and metrologists in automotive, precision machining, manufacturing, electronics, and medical device markets will greatly benefit from the Contour LS-K for many applications, including mechanical testing, QA/QC inspection, process control, and R&D.

“At Bruker we have a solid foundation of industrial metrology excellence; it is a core part of our culture,” said James Earle, Vice President and General Manager of Bruker’s Tribology, Stylus and Optical Metrology Business. “With LightSpeed focus variation, we expand the reach of that gold standard approach to provide an underserved community with all the benefits of speed and convenience, but without compromising the integrity of the metrology.”