Thermo Fisher Scientific launches new semiconductor failure analysis products

Thermo Fisher Scientific has announced the launch of three new products for semiconductor failure analysis labs.

The first of these is the Helios G4 plasma focused ion beam system, which is designed to deprocess and provide ultra-high-resolution scanning electron microscope analysis on a wide variety of semiconductor devices.

Meanwhile, the flexProber system is designed to help engineers to quickly locate and identify electrical faults, which helps to determine faults both at the interconnect and the transistor levels of the semiconductor wafer.

Finally, the company is launching the Themis S transmission electron microscope, which provides atomic-level resolution imaging and high-throughput chemical analysis using challenging semiconductor devices.

The three products have been introduced in response to the rapid evolution of the semiconductor market pace, with strong growth seen in the memory, foundry, Internet of Things, advanced packaging and display markets.

Rob Krueger, vice-president and general manager for semiconductors at Thermo Fisher Scientific, said: "Our suite of failure analysis tools covers a diverse set of semiconductor customers with a wide array of requirements."

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