Horiba extends spectral range of Auto SE sample analysis

Horiba Scientific has enhanced the capabilities of its Auto SE thin film measurement tool, which now covers the wavelength range from 440 to 1,000 nanometres.

According to the firm, the product’s spectral range has been extended in the near infrared, making it ideally suited to use with photovoltaic, semiconductor, flat panel display and optoelectronic thin film applications.

Horiba stated that the Auto SE continues to offer users simple thin film measurement with its push-button operation, which allows quick and easy sample analysis.

The instrument’s features include “an automatic XYZ stage, real-time imaging of the measurement site with MyAutoView vision system and integrated microspot optics”.

In addition, the Auto SE offers in-built diagnostic indicators for automatic problem detection and troubleshooting.

Horiba director Denis Cattelan described the Auto SE as “a major turning point for spectroscopic ellipsometry” in 2008, when it won the EuroAsia IC Industry New System Award.