Agilent Technologies releases dual-view atomic spectrometer

Agilent Technologies has announced the launch of a new atomic spectroscopy device that offers quicker and more efficient performance in various applications.

The Agilent 5100 Inductively Coupled Plasma-Optical Emission Spectrometer (ICP-OES) is able to run samples faster and use less gas, while maintaining a high standard of performance, even on the toughest samples.

Conventional dual-view systems require up to four sequential measurements per sample, but Agilent's solution uses only one, thanks to its innovative Dichroic Spectral Combiner and Synchronous Vertical Dual-view technologies.

The Agilent 5100 could therefore be beneficial for labs involved in food, environmental and pharmaceuticals testing, as well as mining and industrial applications.

Philip Binns, Agilent's vice-president of spectroscopy products, said: "Already the performance leader in ICP-OES, Agilent has raised the bar with a system that sidesteps the usual compromises in speed and robustness associated with dual-view analysis."

This comes after the firm announced an alliance with Bruker last week to create compatible instrument drivers for their respective gas chromatographs.